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Tight-binding formulation of the dielectric response in semiconductor nanocrystals

Articolo
Data di Pubblicazione:
2007
Abstract:
We report on a theoretical derivation of the electronic dielectric response of semiconductor nanocrystals using a tight binding framework. Extending to the nanoscale the Hanke and Sham approach [Phys. Rev. B 12, 4501 (1975)] developed for bulk semiconductors, we show how local field effects can be included in the study of confined systems. A great advantage of this scheme is that of being formulated in terms of localized orbitals and thus it requires very few computational resources and times. Applications to the optical and screening properties of semiconductor nanocrystals are presented here and discussed. Results concerning the absorption cross section, the static polarizability, and the screening function of InAs (direct gap) and Si (indirect gap) nanocrystals compare well to both first principles results and experimental data. We also show that the present scheme allows us to easily go beyond the continuum dielectric model, based on the Clausius-Mossotti equation, which is frequently used to include the nanocrystal surface polarization. Our calculations indicate that the continuum dielectric model, used in conjunction with a size dependent dielectric constant, underestimates the nanocrystal polarizability, leading to exceedingly strong surface polarization fields.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
SILICON QUANTUM DOTS; LOCAL-FIELD; OPTICAL-PROPERTIES; POROUS SILICON; NANOSTRUCTURES
Elenco autori:
Ninno, Domenico
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/169966
Pubblicato in:
PHYSICAL REVIEW. B, CONDENSED MATTER AND MATERIALS PHYSICS
Journal
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URL

http://prb.aps.org/abstract/PRB/v76/i8/e085326
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