Data di Pubblicazione:
2005
Abstract:
The magnetic domain wall width of T-shaped permalloy structures has been measured using a photoemission electron microscope and x-ray magnetic dichroism. The results are compared to micromagnetic simulations. The shape of the structures allows us to analyze 90 degrees Neel walls. We find a decrease in domain wall width with decreasing contact dimensions as expected by theory and in good agreement with our micromagnetic simulations.
Tipologia CRIS:
01.01 Articolo in rivista
Elenco autori:
Heun, Stefan
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