Analytical electron microscopy of Si 1- x Ge x/Si heterostructures and local isolation structures

Academic Article
Publication Date:
1995
Iris type:
01.01 Articolo in rivista
Keywords:
MONTE-CARLO SIMULATION; X-RAY-MICROANALYSIS; THIN-FILMS; DIFFRACTION
List of contributors:
Authors of the University:
Handle:
https://iris.cnr.it/handle/20.500.14243/198628
Published in:
MATERIALS SCIENCE AND TECHNOLOGY
Journal