Data di Pubblicazione:
2011
Abstract:
An investigation of the structural, magnetic and electronic properties of H 3 nm thick Mn5Ge3 films epitaxially grown on a Ge(1 1 1)-c(2 × 8) reconstructed surface is reported. High resolution transmission electron microscopy and selected area electron diffraction give evidence of 2.2% in-plane compressive strain between the Mn5Ge3 film and the Ge substrate. Magnetooptical Kerr effect measurements show that the films are ferromagnetic with a Curie temperature of H 325 K. The analysis of Ge 3d core level photoelectron spectra of the Mn5Ge3 films allows determining an upper limit of 76 meV for the Ge 3d5/2 core-hole lifetime broadening. The Ge 3d3/2 core-hole lifetime broadening is found to be 15 meV larger than that of the Ge 3d5/2 core hole, because of the existence of a CosterKronig decay channel due to the metallic character of Mn5Ge3.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
Metal-semiconductor magnetic thin film structure; Mn5Ge3; Electron microscopy; Transmission high-energy electron diffraction; Synchrotron radiation photoelectron spectroscopy
Elenco autori:
DE PADOVA, IRENE PAOLA; Olivieri, Bruno; Ottaviani, Carlo; Perfetti, Paolo; Quaresima, Claudio
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