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Nonlinear characterization of nm-thick dielectric layers using Surface Plasmon Resonance techniques
Academic Article
Publication Date:
2003
Iris type:
01.01 Articolo in rivista
List of contributors:
Sottini, Stefano; Toci, Guido; Giorgetti, Emilia; Margheri, Giancarlo
Authors of the University:
GIORGETTI EMILIA
MARGHERI GIANCARLO
TOCI GUIDO
Handle:
https://iris.cnr.it/handle/20.500.14243/207684
Published in:
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA. B, OPTICAL PHYSICS
Journal
