Identification of forgeries in historical enamels by combining the non-destructive scanning XRF imaging and alpha-PIXE portable techniques

Particle induced X-ray emission performed with alpha particles (alpha-PIXE) and scanning X-ray fluorescence (XRF) imaging have been used for the non-invasive investigation of three enameled artworks dated back to the XI-XII century AD. The attribution of the three objects has been performed based on art historical considerations even if an analytical investigation was never applied to confirm their authenticity.