Line integration effects on ion temperatures in tokamak plasmas measured with neutron emission spectroscopy

The line integrated line emission measured by neutron spectrometers at JET along sight lines in the vertical and horizontal planes has been simulated in Monte Carlo calculations to determine the relationship between the measured (effective) ion temperature (Teff) relative to the peak value of the profile (T0). The general sight line dependence of (Teff) was expressed analytically for circular plasmas which was used to explain the simulated results for the actual JET sight lines. The analytical model with parametrization of sight lines and plasma profiles is described and the results are used to discuss dual sight line measurements that can be tested at JET and its forward implications for study burning (nearly thermal) plasmas of ITER.