Data di Pubblicazione:
2002
Abstract:
The structural and magnetic properties of [Co(dCo)/Au(22A( )]30 multilayers grown by RF sputtering on non-etched
Si (1 0 0) substrates have been studied. The thicknesses of the Co layers (dCo) were 6, 9 and 12A( . The magnetic
properties were investigated by means of an alternating gradient-force magnetometer and magnetic force microscopy.
The domain configuration and its dependence on the thickness of the elemental magnetic layer are shown. In addition,
the correlation between the shape of the hysteresis loops and the domain configuration at remanence for both in-plane
and perpendicular applied magnetic field is discussed.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
Magnetic force microscopy; Magnetic multilayers; Perpendicular anisotropy
Elenco autori:
Gubbiotti, Gianluca
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