Magnetic anisotropy of thin Ni(001) films: comparison between static and dynamic techniques

The magnetic anisotropy of epitaxial Cu-Ni-Cu-Si(001) films, with Ni thickness between 17 and 150 A , has been studied by Brillouin light scattering from spin waves. Both the Néel interface anisotropy term and the second-order magnetoelastic coefficient have been assumed as adjustable parameters in the best fit procedure of the effective anisotropy constant as a function of the Ni thickness. These results are in very good agreement with those previously obtained by torque magnetometry