Surface microanalysis of materials by means of Reflected Electron Energy Loss Microscopy

Articolo
Data di Pubblicazione:
1997
Abstract:
The potential of REELM are discussed for the analysis of semiconductors and insulators
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
REELM; Semiconductors; surfaces
Elenco autori:
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/406922
Pubblicato in:
MICROSCOPY AND ANALYSIS
Journal