Data di Pubblicazione:
1985
Abstract:
A structural study on the epitaxial relationships of TiSi2 on <100 > silicon has been carried out by transmission electron microscopy. Metallic films, heat treated at high temperatures (750 and 850°C), react with silicon forming the orthorhombic TiSi2 phase with quite large grains, up to 5 µm in diameter, which present some orientation relationships with the crystalline bulk. They are [011]TiSi2//[001]Si, [110]TiSi2//[001]Si, [010]TiSi2//[001]Si.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
titanium silicide
Elenco autori:
Armigliato, Aldo; Nipoti, Roberta
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