SIMS characterization of noble metal-based thin film electrodes

The influence of the support material on the formation of TiO from the isopropanolic solution of titanium diisopropoxide bis-2,4-pentanedionate on titanium and nickel supports was investigated by Secondary Ion Mass Spectrometry. It was found that the support material strongly influences the penetration characteristics of titania, and via this the structure of the coating-support interface. The penetration of TiO into the support is also influenced by the nature of the noble metal oxide in mixed oxide systems. Concentration depth profiles showed that titania can penetrate deeper into titanium metal in the presence of RuO, while IrO showed a definite hindering effect.