Conductance quantization in Schottky-gated Si/SiGe quantum point contacts
Contributo in Atti di convegno
Data di Pubblicazione:
2007
Abstract:
We report on the fabrication and electronic transport characterisation of Schottky-gated strongly confined Si/SiGe quantum point contacts (QPC). At zero magnetic field and T=450mK the QPC conductance as a function of gate voltage shows a quantization in units of e/h, indicative of transport through 1D modes which appear to lack both spin and valley degeneracy. © 2007 American Institute of Physics.
Tipologia CRIS:
04.01 Contributo in Atti di convegno
Keywords:
1DEG; 2DEG; Conductance quantization; Quantum point contact; Silicon-germanium
Elenco autori:
Giovine, Ennio; Notargiacomo, Andrea; Leoni, Roberto
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