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Interferometric measurement of the tip oscillation amplitude in apertureless near-field optical microscopy

Academic Article
Publication Date:
2005
abstract:
We have implemented an optical homodyne interferometer to measure the tip oscillation amplitude in apertureless near-field optical microscopy. The setup is fully embedded in the microscope's design, avoiding the presence of external arms. Our method is based on the synchronous detection of the interference between the fields reflected by the tip and a glass sample surface, while scanning the tip-sample distance over a few wavelengths. With the help of a simple model, we show how the different interference terms arising at frequencies multiple of the tip oscillation can be exploited to easily achieve sub-Angstrom resolution.
Iris type:
01.01 Articolo in rivista
Keywords:
FORCE MICROSCOPY; RESOLUTION; SNOM; APERTURELESS
List of contributors:
Allegrini, Maria; Gucciardi, PIETRO GIUSEPPE
Authors of the University:
GUCCIARDI PIETRO GIUSEPPE
Handle:
https://iris.cnr.it/handle/20.500.14243/42743
Published in:
REVIEW OF SCIENTIFIC INSTRUMENTS
Journal
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