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Interferometric measurement of the tip oscillation amplitude in apertureless near-field optical microscopy

Articolo
Data di Pubblicazione:
2005
Abstract:
We have implemented an optical homodyne interferometer to measure the tip oscillation amplitude in apertureless near-field optical microscopy. The setup is fully embedded in the microscope's design, avoiding the presence of external arms. Our method is based on the synchronous detection of the interference between the fields reflected by the tip and a glass sample surface, while scanning the tip-sample distance over a few wavelengths. With the help of a simple model, we show how the different interference terms arising at frequencies multiple of the tip oscillation can be exploited to easily achieve sub-Angstrom resolution.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
FORCE MICROSCOPY; RESOLUTION; SNOM; APERTURELESS
Elenco autori:
Allegrini, Maria; Gucciardi, PIETRO GIUSEPPE
Autori di Ateneo:
GUCCIARDI PIETRO GIUSEPPE
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/42743
Pubblicato in:
REVIEW OF SCIENTIFIC INSTRUMENTS
Journal
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