Data di Pubblicazione:
2007
Abstract:
The key role of the pentacene kinetic energy (Ek) in the early stages of growth on SiOx=Si is demonstrated:
islands with smooth borders and increased coalescence differ remarkably from fractal-like
thermal growth. Increasing Ek to 6.4 eV, the morphology evolves towards higher density of smaller
islands. At higher coverage, coalescence grows with Ek up to a much more uniform, less defected monolayer.
The growth, interpreted by the diffusion mediated model, shows the critical nucleus changing from
3 to 2 pentacene for Ek > 5-6 eV. Optimal conditions to produce single crystalline films are envisaged.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
THIN-FILM TRANSISTORS; SIZE DISTRIBUTION; DYNAMICS; MORPHOLOGY
Elenco autori:
Iannotta, Salvatore; Toccoli, Tullio
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