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Bayes credibility intervals for the left-truncated exponential distribution

Academic Article
Publication Date:
1994
abstract:
In this paper, a Bayes approach for statistical inference on life characteristics is proposed, when the underlying lifetime distribution has the left-truncated exponential density function. The proposed Bayes procedure provides credibility intervals on several life characteristics of great interest to the applied reliability engineer, when the experimental data are collected under a randomly censored sampling. The prior technical knowledge is expressed in the form of a prior density on the reliability level at a prefixed time in conjunction with an upper bound on the location parameter. The statistical properties of the proposed Bayes procedure are compared, via Monte Carlo simulation, with those of the Bayes procedure under the noninformative prior, when both correct and uncorrect prior information on the reliability is available. A numerical example is used for illustration and comparison.
Iris type:
01.01 Articolo in rivista
List of contributors:
Pulcini, Gianpaolo; Calabria, Raffaela
Handle:
https://iris.cnr.it/handle/20.500.14243/41991
Published in:
MICROELECTRONICS AND RELIABILITY
Journal
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