Nanoscale reliability aspects of insulator onto wide band gap compounds

Conference Paper

Publication Date:

2014

abstract:

[object Object]

Iris type:

04.01 Contributo in Atti di convegno

Keywords:

Conductive Atomic Force Microscopy; GaN; Scanning Capacitance Microscopy; Scanning Probe Microscopy; SiC

List of contributors:

Authors of the University:

FIORENZA PATRICK

GIANNAZZO FILIPPO

LO NIGRO RAFFAELLA

ROCCAFORTE FABRIZIO

VIVONA MARILENA

Handle:

Book title:

Proc. of 9th IEEE Nanotechnology Materials and Devices Conference (IEEE-NMDC)

URL