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Close to the diffraction limit in high resolution ATR FTIR mapping: demonstration on micrometric multi-layered art systems

Articolo
Data di Pubblicazione:
2017
Abstract:
This paper is aimed at demonstrating the potentiality of high resolution Attenuated Total Reflection Fourier Transform Infrared micro-mapping (micro-ATR-FTIR) to reconstruct the images of micrometric multi-layered systems. This method can be an effective analytical alternative when the layer thickness requires high lateral resolution, and fluorescence or thermal effects prevent the deployment of conventional analytical techniques such as micro-Raman spectroscopy. This study demonstrates the high microATR- FTIR setup performances in terms of lateral resolution, spectral quality and chemical image contrast using a new laboratory instrument equipped with a single element detector. The method has been first validated on mock-ups and then successfully applied on cross-sectional samples from real artworks: Leonardo da Vinci's mural painting, characterised by a few micrometers thin sequence of organic and inorganic layers, and an outdoor marble statue, with a complex sequence of decay products on its surface. This study paves the way to a new investigation modality of micrometric systems, combining high lateral resolution with excellent spectral quality, essential in the field of Cultural Heritage as well as in the wider area of materials and forensic sciences.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
High resolution ATR-micro FTIR
Elenco autori:
Possenti, Elena; Botteon, Alessandra; Sansonetti, Antonio; Fontana, Raffaella; Conti, Claudia; Striova, Jana
Autori di Ateneo:
BOTTEON ALESSANDRA
CONTI CLAUDIA
FONTANA RAFFAELLA
POSSENTI ELENA
SANSONETTI ANTONIO
STRIOVA JANA
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/348198
Pubblicato in:
ANALYST (LOND., 1877, PRINT)
Journal
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URL

https://pubs.rsc.org/en/content/articlelanding/2017/AN/C7AN00873B#!divAbstract
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