Study of Built-in Strain in Porous Silicon by Raman Scattering Measurments

Conference Paper
Publication Date:
2008
Iris type:
04.01 Contributo in Atti di convegno
List of contributors:
Authors of the University:
Handle:
https://iris.cnr.it/handle/20.500.14243/237167
Book title:
Proceedings of 6th Internation conference on Porous Semiconductor Science and Technology,