Simple interferometric method for measuring the refractive index and the thickness of transparent plates

Articolo
Data di Pubblicazione:
2003
Abstract:
A lateral shear interferometer is developed for high accuracy measurement of the refractive indices and thickness of thin films
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
refractive index; interferometry; transparent plates; metrology; thickness
Elenco autori:
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/164669