Skip to Main Content (Press Enter)

Logo CNR
  • ×
  • Home
  • People
  • Outputs
  • Organizations
  • Expertise & Skills

UNI-FIND
Logo CNR

|

UNI-FIND

cnr.it
  • ×
  • Home
  • People
  • Outputs
  • Organizations
  • Expertise & Skills
  1. Outputs

TEM and X-ray diffraction studies of III-V lattice mismatched multilayers and superlattices

Conference Paper
Publication Date:
1995
Iris type:
04.01 Contributo in Atti di convegno
List of contributors:
Salviati, Giancarlo; Lazzarini, Laura; Mazzer, Massimo; Ferrari, Claudio; Romanato, Filippo
Authors of the University:
MAZZER MASSIMO
Handle:
https://iris.cnr.it/handle/20.500.14243/205045
Book title:
Microscopy of Semiconducting Materials
Published in:
INSTITUTE OF PHYSICS CONFERENCE SERIES
Series
  • Use of cookies

Powered by VIVO | Designed by Cineca | 26.5.0.0 | Sorgente dati: PREPROD (Ribaltamento disabilitato)