Structural analysis and depth profiling of nanometric SiO2/SRO multilayers

Academic Article
Publication Date:
2013
Iris type:
01.01 Articolo in rivista
Keywords:
SILICON NANOCRYSTALS
List of contributors:
Authors of the University:
Handle:
https://iris.cnr.it/handle/20.500.14243/184874
Published in:
SIA. SURFACE AND INTERFACE ANALYSIS
Journal