Polarization and higher-order content measurement of a soft-x-ray monochromatized beam with Mo-Si multilayers
Academic Article
Publication Date:
2006
abstract:
A Mo-Si multilayer mirror has been used for determination of the ellipticity and higher-order content of a synchrotron beam. The method is based on the angular measure of multilayer reflectivity in the region of Bragg first- and second-order reflections. Beam parameters were derived by a fitting procedure. (c) 2006 Optical Society of America.
Iris type:
01.01 Articolo in rivista
Keywords:
SYNCHROTRON-RADIATION; DESIGN METHOD; PHOTOEMISSION; ELETTRA; LIGHT
List of contributors:
Nicolosi, Piergiorgio; Mahne, Nicola; Frassetto, Fabio; Pelizzo, MARIA GUGLIELMINA; Giglia, Angelo
Published in: