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High resolution x-ray diffraction and transmission electron microscopy investigation on As and P incorporation in MOCVD and CBE grown In(GaAs)P/InP 'false' multi quantum wells

Conference Paper
Publication Date:
1993
Iris type:
04.01 Contributo in Atti di convegno
List of contributors:
Lazzarini, Laura; Ferrari, Claudio; Salviati, Giancarlo
Handle:
https://iris.cnr.it/handle/20.500.14243/120962
Book title:
Vth IPRM Proceedings
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