Data di Pubblicazione:
2009
Abstract:
A simple technique for the growth of SrO-terminated SrTiO3 surfaces is reported. High quality
SrTiO3 epitaxial films were grown by reflection high energy electron diffraction assisted pulsed
laser deposition on suitably prepared NdGaO3 (110) substrates. The surface properties, analyzed
within a growth/characterization multichamber ultrahigh vacuum system by photoemission
spectroscopy performed on the core-level spectra of Sr and Ti, low energy electron diffraction-,
scanning tunneling-, and atomic force microscopy, are fully consistent with a single Sr oxide
termination. The availability of such high quality SrO-terminated SrTiO3 surfaces is of major
importance for the controlled growth of oxide epilayers and interfaces.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
Atomic force microscopy; core levels; photoemission; pulsed laser deposition; reflection high energy electron diffraction; scanning tunnelling microscopy; strontium compounds; substrates; surface structure; vapour phase epitaxial growth
Elenco autori:
MILETTO GRANOZIO, Fabio; Salluzzo, Marco
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