Electrical characterization of InAs/GaAs quantum dot structures

The electrical properties of InAs quantum dots (QD) in InAs/GaAs structures have been investigated by space charge spectroscopy techniques, current-voltage and capacitance-voltage measurements. Au/GaAs/InAs(QD)/GaAs Schottky barriers as well as ohmic/GaAs/lnAs(QD)/GaAs/ohmic structures have been prepared in order to analyze the apparent free carrier concentration profiles across the QD plane, the electronic levels around the QD and the electrical properties of the GaAs/InAs(QD)/GaAs heterojunction. Accumulation and/or depletion of free carriers at the QD plane have been observed by Capacitance-Vultage (C-V) measurements depending on the structure parameters and growth procedures. Similarly, quantum dot levels which exhibit distributions in energy have been detected by Deep Level Transient Spectroscopy (DLTS) and Admittance Spectroscopy (AS) measurements only on particular structures. Finally, the rectification properties of the InAs/GaAs heterojunction have been investigated and the influence of the related capacitance on the measured capacitance has been evidenced.