Strain effects on the microscopic structure of an InGaAs epilayer in InGaAs/GaAs heterostructures: a theoretical study
Articolo
Data di Pubblicazione:
1994
Abstract:
Several strained structures of two ideal In Gaz As compounds have been investigated by performing
ab initio total-energy and atomic-force calculations in order to give a microscopic interpretation
of extended x-ray-absorption Bne-structure results on strained In Gaz As/GaAs heterostructures.
The achieved results show that the strain is accomodated by signi6cant bond-angle
distortions and small In-As bond contractions. A striking, stretched Ga-As distance (close to the
In-As one) observed in the strained heterostructures should not be related therefore to the strain
accomodation occurring in the In Ga& As epilayer. Anisotropic strain eKects are found, which lead
to two diferent next-nearest-neighbor distances for atomic pairs on and out of the planes parallel
to the In Gaq As/GaAs interfaces.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
semiconductor
Elenco autori:
Scavia, Guido
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