X-RAY-INDUCED REDUCTION EFFECTS IN THE K-EDGE SPECTRA OF SOME CU-2+-CONTAINING MATERIALS

Articolo

Data di Pubblicazione:

1982

Abstract:

We use XPS techmiqes to evaluate how x ray radiation affects the chemistri co copper-based materials

Tipologia CRIS:

01.01 Articolo in rivista

Keywords:

XPS; x ray synchrotron absorption; copper materials

Elenco autori:

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Pubblicato in:

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