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Structural and morphological analyses of tungsten oxide nanophasic thin films obtained by MOCVD

Articolo
Data di Pubblicazione:
2003
Abstract:
Nanophasic tungsten oxide thin films were deposited at 500 C on quartz and glass substrates starting from W(CO)6 using the metal organic chemical vapour deposition technique. The films were analysed by X-ray diffraction, X-ray photoelectron spectroscopy and scanning electron microscopy. By using an O2+H2O atmosphere, the fully oxidized tungsten yellow compound was obtained (tetragonal WO3) with a morphology characterized by pyramidal-shaped grains. The average crystallite size resulted of 75 nm. Conversely, under a N2+H2 atmosphere, a polycrystalline blue deposit was obtained, corresponding mainly to a mixture of oxides in the composition range between WO2:7 and WO3. The crystallites have an average size of 50 nm and the morphology revealed a packed structure, with grains in a singular wool skein shape.
Tipologia CRIS:
01.01 Articolo in rivista
Elenco autori:
Zanella, Pierino; Carta, Giovanni; Barreca, Davide; Rossetto, GILBERTO LUCIO
Autori di Ateneo:
BARRECA DAVIDE
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/4080
Pubblicato in:
SURFACE SCIENCE
Journal
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