Magnetic Depth Profiling of the Co/C60 Interface Through Soft X-Ray Resonant Magnetic Reflectivity

We have probed the structural and magnetic properties of a ferromagnetic/organic interface constituted by a polycrystalline Co layer deposited on a fullerene thin film through resonant soft X-ray reflectivity measurements. The fitting analysis of the reflectivity indicates the formation of a sharp interface with limited intermixing and a null remanent magnetization in a ~1 nm thick region of the Co film at the interface with C60. This information contributes to elucidate the role of organic-inorganic interfaces in the charge and spin transport inside organic spintronic devices.