ZST type material for dielectric resonators and substrates for hybrid integrated circuits

(Zr0.8Sn0.2)TiO4 ceramic (ZST) has been prepared and characterized. The effect of sintering parameters were investigated. The material has a dielectric constant about 36 and high values of Qxf (From 32.000 to 50.000 at microwave frequencies). Investigations on whispering gallery modes revealed low dielectric losses in millimeter wave domain. An intrinsic quality factor of 480 was measured at 136.3 GHz. The dielectric properties make the ZST material very attractive to microwave and millimeter wave applications.