Instability in a-Si:H Thin-Film Transistors: A New Method to Discriminate Between Charge Injection and Defect Creation

Conference Paper
Publication Date:
1992
Iris type:
04.01 Contributo in Atti di convegno
List of contributors:
Authors of the University:
Handle:
https://iris.cnr.it/handle/20.500.14243/3812
Published in:
MRS PROCEEDINGS
Series