Data di Pubblicazione:
2006
Abstract:
A trend of increased near-surface valence band maximum band bending with increasing O/Ga relative fraction was observed, extrapolating to 2.7 eV +/- 0.1 eV for pristine GaN surfaces (0% O 1s peak area). This trend of apparent oxide overlayer coverage affecting the band bending linearly could lead to better understanding and characterization of oxidized GaN surfaces to control band bending for sensors or other devices
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
ELECTRICAL-PROPERTIES; ELECTRONIC-PROPERTIES; GALLIUM NITRIDE; HETEROSTRUCTURES; TRANSISTORS
Elenco autori:
Losurdo, Maria; Bruno, Giovanni
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