Data di Pubblicazione:
2011
Abstract:
Thermally treated silicon rich oxides (SRO) used as starting
material for the fabrication of silicon nanodots represent
the basis of tunable bandgap nanostructured materials
for optoelectronic and photonic applications. The optical
modelization of such materials is of great interest, as
it allows the simulation of reflectance and transmittance
(R&T) spectra, which is a powerful non destructive tool
in the determination of phase modifications (clustering,
precipitation of new phases, crystallization) upon thermal
treatments. In this paper, we study the optical properties
of a variety of as-deposited and furnace annealed SRO
materials. The different phases are treated by means of
the effective medium approximation. Upon annealing at
low temperature, R&T spectra show the precipitation of
amorphous silicon nanoparticles, while the crystallization
occurring at temperatures higher than 1000 °C is also
clearly identified, in agreement with structural results.
The existing literature on the optical properties of the
silicon nanocrystals is reviewed, with attention on the
specificity of the compositional and structural characteristics
of the involved material.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
nanodots; silicon; optical properties
Elenco autori:
Desalvo, Agostino; Canino, MARIA CONCETTA; Allegrezza, Marco; Terrasi, Antonio; Miritello, MARIA PILAR; Summonte, Caterina; Mirabella, Salvatore
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