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Spatially localized UV-induced crystallization of SnO2 in photorefractive SiO2-SnO2 thin film

Contributo in Atti di convegno
Data di Pubblicazione:
2010
Abstract:
We report on the formation of spatially localized crystals in SiO 2-SnO2 thin films fabricated by the sol-gel technique. This material presents an intense absorption band (??10 3cm-1) in the UV region. A continuous wave UV laser operating at 266nm focused through a microscope objective is used as an effective tool to modify locally the matrix containing photorefractive SnO 2. The UV micro-Raman spectrometer is used to study the evolution of SnO2 crystals in the thin film. The appearance of the Raman scattering peak at 621cm-1, assigned to the A1g mode of rutile SnO2, confirms the formation of nanocrystals in the focalised UV irradiated zone. © 2010 Copyright SPIE - The International Society for Optical Engineering.
Tipologia CRIS:
04.01 Contributo in Atti di convegno
Keywords:
Silicate; Tin-oxide; glass-ceramic; europium; planar waveguides
Elenco autori:
Berneschi, Simone; Ferrari, Maurizio; NUNZI CONTI, Gualtiero; Chiasera, Alessandro; Chiappini, Andrea; Righini, Giancarlo
Autori di Ateneo:
BERNESCHI SIMONE
CHIAPPINI ANDREA
CHIASERA ALESSANDRO
NUNZI CONTI GUALTIERO
RIGHINI GIANCARLO
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/155065
Pubblicato in:
PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING
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