Data di Pubblicazione:
1993
Abstract:
The early stages of Sb films deposited at room temperature on Si(I 00)2 X 1 surfaces have been investigated by angle-integrated and angle-resolved Auger, spectroscopy. A comparison between the experimental results and the predictions of simple deposition models indicates that the growth of the Sb film proceeds by island formation. Without any annealing, a uniform overlayer never develops up to films 4 nm thick.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
SI(001); ADSORPTION; GROWTH; AES
Elenco autori:
Barchesi, Claudio; Ferrari, Luisa; Cricenti, Antonio; Selci, Stefano
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