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Microwave operation of sub-micrometer gate surface channel MESFETs in polycystalline diamond

Articolo
Data di Pubblicazione:
2009
Abstract:
Submicron gate-length metal semiconductor field effect transistors (MESFETs) were fabricated on hydrogen-terminated-large grain polycrystalline diamond. Devices showed high drain-source current (140 ma/mm) and large transconductance values (50 ms/mm), with a cut-off frequency f(r) = 10 GHz and a maximum oscillation frequency, f(max) up to 35 GHz. These values are obtained through the fabrication of devices with geometry and active region dimensions (200-500 nm gate length) compatible with available microelectronic technologies.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
dc and rf performance; device technology; electrical characteristics; semiconductor devices; wide band semiconductors
Elenco autori:
Giovine, Ennio; Calvani, Paolo
Autori di Ateneo:
GIOVINE ENNIO
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/36949
Pubblicato in:
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS (PRINT)
Journal
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