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Controlling QCLs for frequency metrology from the infrared to the THz range

Contributo in Atti di convegno
Data di Pubblicazione:
2018
Abstract:
The Quantum Cascade Laser is becoming a key tool for plenty of applications, from the IR to the THz range. Progress in nearby areas, such as the development of ultra-low loss crystalline microresonators, optical frequency standards and optical fiber networks for time&frequency dissemination, are paving the way to unprecedented applications in many fields. For the most demanding applications, a thorough control of quantum cascade lasers (QCLs) emission must be achieved. In the last few years, QCLs unique spectral features have been unveiled, while multifrequency, comb-like QCLs have been demonstrated. Ultra-narrow frequency linewidths are necessary for metrological applications, ranging from cold molecules interaction and ultra-high sensitivity spectroscopy to infrared/THz metrology. In our group, we are combining crystalline microresonators, with a combined high quality factor in the infrared and ultra-broadband spectral coverage, with QCLs and other nonlinear highly coherent and frequency referenced sources. Frequency referencing to optical fiber-distributed optical primary standards offers astonishing stability values of 10(-16) @1-sec timescales in laboratory environments but several hundred kilometres far away from the primary clocks. A review will be given of the present status of research in this field, with a view to perspectives and future applications.
Tipologia CRIS:
04.01 Contributo in Atti di convegno
Keywords:
Quantum Cascade Lasers; Frequency Metrology; Microresonators
Elenco autori:
DE REGIS, Michele; DE NATALE, Paolo; Giusfredi, Giovanni; Mazzotti, Davide; CANCIO PASTOR, Pablo; Bartalini, Saverio; Borri, Simone; Consolino, Luigi; Campo, Giulio; Cappelli, Francesco
Autori di Ateneo:
BARTALINI SAVERIO
BORRI SIMONE
CANCIO PASTOR PABLO
CAPPELLI FRANCESCO
CONSOLINO LUIGI
DE NATALE PAOLO
MAZZOTTI DAVIDE
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/383331
Pubblicato in:
PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING
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