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Influence of the static atomic displacement on atomic resolution Z-contrast imaging

Articolo
Data di Pubblicazione:
2008
Abstract:
The influence of static atomic displacements, due to atomic size effects in alloys with atoms having different covalent or ionic radii, on high angle annular dark field image contrast is studied quantitatively by simulations and experiments. We show that the static displacements can have a large influence on the Z contrast, depending on the alloy composition and on the scanning transmission electron microscopy specimen thickness. This influence has to be taken into account for quantitative chemistry measurement based on Z-contrast imaging.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
DARK-FIELD IMAGES; ALLOYS; SCATTERING; STEM; SEMICONDUCTORS
Elenco autori:
Carlino, Elvio; Grillo, Vincenzo
Autori di Ateneo:
CARLINO ELVIO
GRILLO VINCENZO
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/119967
Pubblicato in:
PHYSICAL REVIEW. B, CONDENSED MATTER AND MATERIALS PHYSICS
Journal
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URL

http://prb.aps.org/abstract/PRB/v77/i5/e054103
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