Data di Pubblicazione:
2005
Abstract:
The magnetic properties of synthetic antiferromagnetic Sis100d/Ta s5 nmd/Cost1d /
Ru s0.65 nmd/Cost2d/Ta s10 nmd with an obliquely sputtered Ta underlayer are reported as a function of the
top Co layer thickness, t2. The morphological origin of the large in-plane magnetic anisotropy created by the
obliquely sputtered Ta underlayer is revealed by atomic force microscopy. The magnetic anisotropy of the base
Co layer is determined by measuring the dispersion of the Damon-Eshbach spin-wave mode with Brillouin
light scattering. Ferromagnetic resonance measurements and hysteresis loops reveal that both the anisotropy
and the saturation field of the trilayer system decrease with increasing top Co layer thickness. The dependence
of the saturation field on layer thickness is fitted to an energy minimization equation that contains both bilinear
and biquadratic exchange coupling constants. Magnetoresistance and polarized neutron reflectometry results
both confirm that the magnetic reversal process of the system is through magnetic domain formation followed
by rotation.
Tipologia CRIS:
01.01 Articolo in rivista
Elenco autori:
Gubbiotti, Gianluca
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