Data di Pubblicazione:
2004
Abstract:
The structural and magnetic properties of FeTaN/FeSm/FeTaN multilayers, deposited by dc magnetron sputtering,
have been investigated as function of the alloy layers thickness. Structural and morphological characterizations,
accomplished by transmission electron microscopy, X-ray reflectivity and grazing-incidence X-ray diffraction, account
for a well-defined layered structure of the multilayers with a limited interface roughness. The magnetization reversal
process is examined experimentally using magneto-optical Kerr vector magnetometry by measuring the longitudinal
and transverse hysteresis loops. It is found that, for soft layer thickness above 3.2 nm, the magnetization reversal occurs
via the formation of a stable exchange-spring state in which the magnetic moments of the outermost soft layer gradually
rotates away from the unswitched underlying hard layer
Tipologia CRIS:
01.01 Articolo in rivista
Elenco autori:
Gubbiotti, Gianluca
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