Data di Pubblicazione:
2017
Abstract:
In this paper we present the application of a computationally efficient Rigorous Coupled-Wave Analysis method to solve the electromagnetic radiation scattering problem in devices featuring nano-structured interfaces and multilayer structures. The method, already successfully used to simulate photon propagation and absorption in thin-film solar cells, is used in this work to compute the optical reflectivity of micro-mirrors in Micro-Opto-Electro-Mechanical Systems (MOEMS).
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
Rigorous Coupled-Wave Analysis (RCWA); Micro-Opto-Electro-Mechanical Systems (MOEMS); optical simulation; electromagnetic solver
Elenco autori:
Cianci, Elena; Lamperti, Alessio; Tallarida, Graziella; Wiemer, Claudia
Link alla scheda completa: