Application of a HEPE-oriented 4096-MAPS to time analysis of single electron distribution in a two-slits interference experiment

The Young-Feynman two-slit experiment for single electrons has been carried out by inserting in a conventional transmission electron microscope two nanometric slits and a fast recording system able to measure the electron arrival-time. The detector, designed for experiments in future colliders, is based on a custom CMOS chip of 4096 monolithic active pixels equipped with a fast readout chain able to manage up to 10(6) frames per second. In this way, high statistic samples of single electron events can be collected within a time interval short enough to guarantee the stability of the system and coherence conditions of the illumination. For the first time in a single electron two-slit experiment, the time distribution of electron arrivals has been measured.