Data di Pubblicazione:
2010
Abstract:
Measurements of the refractive index of two different Lithosil samples and a sample of Suprasil 312 at cryogenic temperature and at 293 K are reported for the spectral range from 480 nm to 894 nm. Such data are useful for the design of fused silica optical components and systems destined for space missions.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
Optical metrology; refractive index; cryogenic measurements
Elenco autori:
Molesini, Giuseppe; Vannoni, Maurizio; Sordini, Andrea
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