Measurements of fungal wood decay on Scots pine and beech by means of X-ray microdensitometry

In this work, we present a fast and promising method to evaluate the natural durability of wood based on X-ray microdensitometry. Tested on beech and Scots pine wood samples, our findings show that this methodology and the traditional EN standards methodology based on mass loss are strongly correlated. X-ray methodology is less time consuming (we can detect the effectiveness of the attack within 5-6 weeks) and less expensive (very cheap plastic Petri dishes instead of the expensive glass Kolle flasks); moreover, the proposed method allows to thoroughly examine the phases and the kinetics of the fungal attack, and to investigate the spatial repartition of the attack within the samples due to the low thickness of the sample.