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High-quality InGaAs/InP interfaces by the use of tertiary-butylarsine in MOVPE multi-quantum wells

Articolo
Data di Pubblicazione:
2002
Abstract:
Tert-butylarsine, a less toxic and dangerous compound than arsine (AsH3), is investigated as a precursor for metalorganic vapor phase epitaxy. We have performed a comparative study on two InGaAs/InP multi-quantum well samples sharing a nominally identical structure and composition but grown with these two different arsenic sources. X-ray diffraction and optical spectroscopy (reflectivity and photoluminescence) show high material quality for both sets of samples. In particular, the use of tert- butylarsine promotes flatter interfaces characterized by a compositional grading of a few monolayers.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
MOVPE; tert-butylarsine; heterostructure; interfaces; III-V semiconductor
Elenco autori:
EL HABRA, Naida; D'Andrea, Andrea; Carta, Giovanni; Schiumarini, Donatella; Rossetto, GILBERTO LUCIO; Zanella, Pierino; Selci, Stefano
Autori di Ateneo:
SCHIUMARINI DONATELLA
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/148075
Pubblicato in:
JOURNAL OF CRYSTAL GROWTH
Journal
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http://www.sciencedirect.com/science/article/pii/S0022024802016597
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