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Energetics of native point defects in cubic silicon carbide

Articolo
Data di Pubblicazione:
2004
Abstract:
n this work we present a detailed investigation of native point defects energetics in cubic SiG, using state-of-the-art first principles computational method. We find that, the carbon vacancy is the dominant defect in p-type SiC, regardless the growth conditions. Silicon and carbon antisites are the most common defects in n-type material in Si-rich and C-rich conditions respectively. Interstitial defects and silicon vacancy are less favorite from the energetic point of view. The silicon vacancy tends to transform into a carbon vacancy-antisite complex and the carbon interstitial atom prefers to pair to a carbon antisite. The dumbbell structure is the lowest-energy coufiguration for the isolated carbon interstitial defect, and the tetrahedral interstitial silicon is a stable structure in p-type and intrinsic conditions, while in n-type material the dumbbell configuration is the stable one. Our results suggest that, in samples grown in Si-rich stoichiometric conditions, native defects are a source of n-doping and of compositional unbalance of nominally intrinsic SiC. in accord with experimental evidence.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
silicon carbide; semiconductors; point defects; doping; DFT
Elenco autori:
Colombo, Luciano; Bernardini, Fabio; Mattoni, Alessandro
Autori di Ateneo:
MATTONI ALESSANDRO
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/3047
Pubblicato in:
THE EUROPEAN PHYSICAL JOURNAL. B, CONDENSED MATTER PHYSICS
Journal
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