Data di Pubblicazione:
2008
Abstract:
Using joined super-lattice Kinetic Monte Carlo simulations, continuous modelling and recent experimental data on the homoepitaxial growth of 4H Silicon Carbide we study the transition between monocrystalline and polycrystalline growth in terms of misorientation cut, growth rate and temperature. We compare these optimally calibrated results both with previous continuous models and literature data. We demonstrate that this study was, indeed, necessary to correctly reformulate the phase diagram of the transition. © (2009) Trans Tech Publications, Switzerland.
Tipologia CRIS:
01.01 Articolo in rivista
Elenco autori:
Camarda, Massimo; LA MAGNA, Antonino; LA VIA, Francesco
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