Lineshape analysis of Raman scattering from LO and SO phonons in III-V nanowires

Micro-Raman spectroscopy is employed to study the phonon confinement in Au- and Mn-catalyzed GaAs and InAs nanowires. The phonon confinement model is used to fit the LO phonon peaks, which also takes into account the contribution to the asymmetry of the line shape due to the presence of surface optical (SO) phonons and structural defects. This also allows us to determine the correlation lengths in these wires, that is the average distance between defects and the defect density in these nanowires. Influence of these defects on the SO phonon is also investigated. A good agreement between the experimental results and the calculations for the SO phonon mode by using the dielectric continuum model is also obtained.